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TEST SERVICES:
Minco's engineering staff has a wide variety of experience in designing and producing advanced test solutions designed to thoroughly evaluate component reliability. Over our 25 years, Minco has built an extensive qualified test program library, which many times leads to lower initial start-up cost and reduced lead times. Utilizing our large inventory of programmable burn-in boards, Minco can easily configure a burn-in or life test set-up suited for either dynamic or static bias excitation.
Digital
DTL / TTL / ECL / CMOS
Memory
SRAM / SSRAM
DRAM / SDRAM
VRAM
EEPROM / FLASH
FIFO
Dual-Port RAM
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±20 Volts / 100mA
Transition Times to 200ps
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Linear & Mixed Signal
Operational / Instrumentation Amplifiers
Comparator
Voltage Regulator / Reference
ADC / DAC
Power Management
Analog Switches / Analog Multiplexers
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±120 Volts / 20 Amps
.05 pA resolution
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Discrete
Diodes / Diode Arrays
Transistors / Transistor Arrays
MOSFET's / HEXFET's
SCR's / Triac's
Hall Effect Switches
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±1000 Volts / 200 Amps
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Electrical Probe
· Up to 8" Wafers
· +25°C to +175°C
· 100% Hot Probe
· Wafer Mapping
· Product Binning
· Die Form Probe
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Tester Capability
· Sentry 20 - 120 Pin High Speed Head, 60 Pin High Voltage Head
· Sentry 10 - 60 Pin High Speed Head, 60 Pin High Voltage Head
· Amicronix Series 400 - Linear / Mixed Signal Test System
· (2) AD2020 - Linear / Mixed Signal Test System
· (2) Linear / Mixed Signal IEEE Test System
· Testronics 201C - Discrete Component Test System v
· (2) ECL IEEE Test System - 200 ps
· CMOS IEEE Test System - .05 pA resolution
· Large Variety of Standard High Precision Bench Test Equipment
· Automated Handlers - +175°C to -65°C
· (4) Semi-auto Temperature Forcing Units
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Burn-In/Life Test Capability
(4) Custom Product Burn-In Ovens (ideally suited for VLSI, LSI, and Logic/Linear)
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