Recognized as an industry leader in the design, manufacture and distribution of semiconductor solutions that improve the quality of life and security for a better world.
Test Services | Semiconductor Testing
Improve your program cost management with semiconductor testing
Proper semiconductor testing can reduce the occurrence of future issues with your Hi-Rel, mission-critical project. Minco Technology Labs, LLC has engineers with the extensive experience and knowledge required to extensively test your components.
Our engineers have diverse experience across semiconductor device architecture, advanced semiconductor test equipment and software. This experience, combined with an extensive catalog of existing devices supported and our ability to create custom test and service solutions, will allow you to:
- Reduce your out-of-pocket start-up costs
- Improve long-term program cost management
- Boost time-to-market for your end product
Discuss the specifications of your project with our team, so we can help you find the general or custom solution to your semiconductor testing requirements.
Solution for your environmental and mechanical test requirements
Environmental and mechanical semiconductor testing is held to specific standards. As a DLA-certified microcircuit manufacturer, Minco Technology Labs, LLC, can perform individual and full MIL-STD-883 screenings.
Quality conformance inspection (QCI) testing meets acquisition document requirements
Whether you need complete QCI testing in accordance with MIL-STD-883, Method 5004 or a customized test plan to meet your unique project requirements, our team has the expertise to ensure the device and lot conform to your acquisition document requirements.
Semiconductor evaluation through custom electrical test
Electrical evaluations must test semiconductor components in a wide range of environmental factors. The diverse experience of our engineers, a rigorous testing methodology and our ability to create custom semiconductor test and service solutions allow Minco Technology Labs, LLC to offer our customers superior electrical testing.
Achieving high quality and reliability through extensive microcircuit screening
The integrity of your microcircuit components should not be a concern. As a DLA-certified microcircuit manufacturer, we perform 100% of the screening requirements of MIL-STD-883, Method 5004.
Extensive testing and screening options available, including custom solutions
To give you an understanding of the device categories and services available through Minco Technology Labs, LLC, we have listed them below. Our general list is quite extensive, covering areas including environmental testing and screening, mechanical testing and qualification and quality conformance.
However, if your project requirement cannot be satisfied by our list, please contact our team so we can discuss the specifications of your project and create a custom solution to meet your requirements. We value the importance of your time. That's why we will provide custom quotes within five business days.
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Device Category |
Architecture |
Form |
Wafer Probe limits |
Limit sets |
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Component |
Wafer |
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Digital (SSL) |
BiPolar |
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Up to 8", +25ºC to +175ºC, 100% HOT Plate |
±20V / 100mA, Trasistion Rate: 200ps |
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TTL |
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ECL |
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CMOS |
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BiCMOS |
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Memory |
PROM |
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Up to 8", +25ºC to +175ºC, 100% HOT Plate |
±20V / 100mA, Trasistion Rate: 200ps |
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Linear & Mixed Signal |
Op Amps |
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Up to 8", +25ºC to +175ºC, 100% HOT Plate |
±120V / 20 Amps, Resolution: 0.05pA |
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Instrument Amps |
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Comparators |
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Voltage Regulators |
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Voltage References |
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ADC/DAC |
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Power Management |
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Analog Switches |
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Analog Multiplexers |
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Discrete |
Diodes / Diode Arrays |
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Up to 8", +25ºC to +175ºC, 100% HOT Plate |
±1000V / 200 Amps |
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Transistors / Transistor Arrays |
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MOSFETS / HEXFETS |
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SCR's / Triac's |
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Hall Effect Switches |
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Test Capabilities / Equipment |
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Manufacturer / Model |
Series / Model |
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LTX-Credence |
ASL1K |
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LTX-Credence |
X Series, LX |
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Amicronix |
400 |
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Testronics |
Discrete |
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IEEE Test System |
Linear / Mixed Signal |
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IEEE Test System |
ECL |
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IEEE Test System |
CMOS |
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Services |
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Test / Description |
MIL Method (883) |
JEDEC (JESD22) |
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Wire Bond Strength |
2011 |
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Constant Acceleration/Centrifuge |
2001 |
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Internal Visual-Monolithic |
2010 |
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Internal Visual-Hybrid |
2017 |
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External Visual |
2009 |
B101 |
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Lead Integrity |
2004 |
B105 |
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Mechanical Shock |
2002 |
B104 |
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Moisture Resistance |
1004 |
A100 |
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PIND |
2020 |
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Resistance to Solvents |
2015 |
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Salt Atmosphere |
1009 |
A107 |
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Seal, Leak test |
1014 |
A109 |
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Solderability |
2003 |
B102 |
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Steady State Life |
1005 |
A103 |
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Temperature Cycling |
1010 |
A104 |
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Thermal Shock |
1011 |
A106 |
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Physical Dimensions |
2016 |
B100 |

