Electronic Systems, Sub-Systems and Semiconductor components operating in environments outside of benign, surface to low-altitude earth orbit atmospheres are subjected to elevated levels of neutrons, heavy ions and protons. The end results to neutron, heavy ion and proton exposure outside of benign, surface to low altitude earth orbit atmospheres is device failure due to ionizing radiation effects.  These radiation effects include accumulated radiation over time as measured in TID (Total Dose), a result of trapped electrons and protons; SEU (Single Event Upset,) a result of exposure to heavy ions and third, displacement damage or SEL (Single event Latch-Up), a resultant effect of exposure to protons.

Types and concentrations of radiating particles in natural space environment will change significantly with earth location, altitude, angle of incident and abnormal or increased solar activity.  Effects over time or the ability for the System, Sub-System or Semiconductor to survive will depend greatly on its radiation hardness, and/or shielding to the types and expected exposures as well as exposure rate.

Minco Technology Labs, LLC, a supplier of Standard and Custom Packaging semiconductor solutions, manufactured to QML Class V, S or Q or MIL-PRF-19500 to the military and aerospace markets, offers its customer product solutions for both Radiation Tolerant and Radiation Hardened categories.  Products offered to the Radiation Tolerant category are supplied by Minco Technology Labs, LLC.  Products offered to the Radiation Hardened category are done so via our strategic alliance with Honeywell’s Microelectronics Group for Radiation Hardened, Mixed-Signal, Digital Logic, ASICS, FPGAs, SERDES and Processors, as well as, A/D Converters, Static Rams (SRAM), MCMs and Non Volatile Memories (NVM).