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Process Flow
|
FLOWCHART INCOMING/ASSY/REWORK |
PROCESS STEP |
DESCRIPTION |
INSPECTION/ TEST CRITERIA |
|---|---|---|---|
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Incoming Raw Material Inspection |
Wafers, Die |
Visual
Dimensional Thickness C of C Verification |
| Packages and Lids |
Dimensional
C of C Verification |
||
| Packaging Materials |
Shelf Life
C of C Verification |
||
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Wafer Probe (If Required) |
100% Die Level Electrical, Test Rejects Are Red Inked | |
|
Wafer Probe Monitor |
Monitor Probing | Probe Defects | |
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Kit for Assembly | Wafer(s) or Die are Kitted with Packages and Lids, Minco Bonding Diagram and Manufacturing Router | |
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Wafer Mount (If Required) |
Preparation for Die Separation | |
|
Wafer Mount Monitor |
Visual Inspection | ||
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Wafer Saw (If Required) |
Die Separation | Alignment Accuracy |
| Wafer Wash | Wash Wafer Utilizing High Pressure DI Water | N/A | |
|
Wafer Saw Monitor |
Saw KERF |
Saw Quality Saw Accuracy |
|
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Die Visual | Visually Inspect Die | Visual Inspection |
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Die Visual Process Monitor |
Visually Inspect Die | Visual Inspection |
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Die Attach | Die Bonded to Package | Defects |
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Epoxy/ JM7000 Cure |
Check Oven Temperature |
Epoxy Cure Temperature |
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Die Attach Monitor |
Visual Quality
Die Shear Test |
|
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Wire Bond | Gold Ball Bonds 0.7 to 1.25 Mil Wire Aluminum Wedge Bonds 1.0 to 25 Mil Wire | Defects |
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Wire Bond Monitor |
Visual Quality
Wire Bond Pull Test |
|
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Pre-Cap Inspection |
Visual Inspection in Accordance with Mil-Std-883, Method 2010, Class B | Visual Inspection |
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Hermetic Seal | Solder Reflow, Glass Frit, Compression Weld | |
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Post Seal Visual Inspection |
Visually Inspect the Package Seal | Visual Inspection |
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Marking | Mark parts Accordance with Applicable Specification | Visual Inspection |
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Stabilization Bake (If Required) |
Bake devices in Accordance with Applicable Specification | N/A |
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Temperature Cycle | Temperature Cycle in Accordance with Mil-Std-883, Method 1010 | N/A |
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Constant Acceleration | Centrifuge in Accordance with Mil-Std-883, Method 2001 | N/A |
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External Visual Inspection |
Visually Inspect in Accordance with Mil-Std-883, Method 1010 | Visual Inspection |
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Fine Leak Test | Fine Leak in Accordance with Mil-Std-883, Method 1014 |
Helium Mass Spectrometer |
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Gross Leak Test | Gross Leak in Accordance with Mil-Std-883, Method 1014 |
Fluorocarbon Bubble Test |
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Pre Burn-In Electrical Parameters |
Test devices in Accordance with Applicable Specification | Electrical Test |
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Burn-In | Burn-In Devices in Accordance with Mil-Std-883, Method 1015 and Applicable Specification | |
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Interim (Post Burn-In) Electrical Parameters | Test devices in Accordance with Applicable Specification | Electrical Test |
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Percent Defective Allowable (PDA) |
Calculation of Lose From Pre Burn-In Parameters to Interim Burn-In Parameters | |
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Final Electrical Test | Test devices in Accordance with Applicable Specification | Electrical Test |
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External Visual | Visually Inspect in Accordance with Mil-Std-883, Method 2009 | Visual Inspection |
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Quality Conformance Inspection Sample Selection |
Sample Selection |









